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带电器件(CDM)模型论文(全文)

1 Chip-level simulation for CDM failures in multi-power ICs
2 Maximum likelihood multipath channel estimation for synchronous-CDM systems
5 Influence of the device package on the results of CDM tests-consequences for tester characterization and test procedure
7 The real CDM field induced ESD waveform from MR heads
8 Influence of tester, test method, and device type on CDM ESD testing
Attenna
9 A correlation study between different types of CDM testers and “real” manufacturing in-line leakage failures
10 Chip-level charged-device modeling and simulation in CMOS integrated circuits
11 Advanced CMOS protection device trigger mechanisms during CDM
12 The importance of standardizing CDM ESD test head parameters to obtain data correlation
13 Issues concerning CDM ESD verification modules-the need to move to alumina
charge plate monitor
14 OCDM a new multicode CDM radio transmission system based on cyclic modified M-sequences-performance evaluation using prototype
15 Performance of multi-carrier CDM and COFDM in fading channels
electrometer
16 Simulation of complete CMOS IO circuit response to CDM stress
17 Advanced CMOS protection device trigger mechanisms during CDM
19 A high-speed DSRC system assisted by an overfill CDM for future seamless road-vehicle communication systems
20 Design and performance of quasi-synchronous multi-carrier CDMA system
22 A route design algorithm for multiple-encoding optical CDM switching network
23 Performance analysis of a multi-code CDM transmission scheme based on cyclic extended spread code as a extension of 3rd generation CDMA system
24 MC-CDM-a promising approach for digital broadcast in the AM-band
25 Degradation of GMR and TMR recording heads using very-short-duration ESD transients
26 Design of integrated services digital broadcasting systems using multirate optical fiber code-division multiplexing
27 Very fast transmission line pulsing of integrated structures and the charged device model
28 Variable-bit-rate video transmission systems using optical fiber code-division multiplexing scheme
35 A simulation analysis of quarter-micron CMOS LSI input circuit behavior under CDM-ESD for protection device improvement
36 Investigation into socketed CDM (SDM) tester parasitics
37 Experiments on high-speed all-optical code-division multiplexing (CDM) systems using a 2n prime code
38 CDM an approach to learning in text categorization
39 Latent gate oxide defects caused by CDM-ESD
40 Quench simulation of the 40 mm aperture SSC-quadrupole magnet connected in series with 50 mm aperture SSC-dipole magnets
41 Database model for design data
42 Error-free 1.24 Gbs 4-chip coherent CDM code converter
46 An experiment on a CDM subcarrier multiplexed optical-fiber local area network
61 Reproducibility of field failures by ESD models - comparison of HBM, socketed CDM and non-socketed CDM
62 A combined socketed and non-socketed CDM test approach for eliminating real-world CDM failures
67 Study of ESD evaluation methods for charged device model
73 ESD evaluation methods for a charged device model
93 ESD failure finger-print-an effective and accurate method for root cause determination
98 Influence of well profile and gate length on the ESD performance of a fully silicided 0.25 μm CMOS technology
99 Wide-band planar monopole antennas
114 4.5 GHz time domain measurement of voltage transition duration due to micro gap discharge as low voltage ESD
119 A case study on hidden ESD events of GMR HGA dynamic test fixture
120 Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions
123 Latent ESD failures in Schottky barrier diodes
125 ESD-sensitivity study of GMR recording heads with a flex-on-suspension head-gimbal assembly
137 Simulation study for the CDM ESD behaviour of the grounded-gate NMOS
138 A compact model for the grounded-gate nMOS behaviour under CDM ESD stress
139 Charged device model (CDM) metrology limitations and problems
158 Analysis of the charge transfer of models for electrostatic discharge (ESD) and semiconductor devices
162 Analysis of the charge discharge processes for the basic ESD models
192 Constant charge and constant potential models for electrostatic discharge (ESD)
194 A novel on-chip electrostatic discharge (ESD) protection for beyond 500 MHz DRAM
196 Sub-micron chip ESD protection schemes which avoid avalanching junctions
198 Analysis of models for electrostatic discharge (ESD) and semiconductor devices

 

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国际先进水平的ESD实验室

ESD-china培训

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美国、日本权威认证ESD专家授课,高水平ESD培训课程。

您能理解和区分两个最常用ESD标志吗?NEW

导电、防静电塑料、橡胶体积电阻率测试 EST991

提供特殊定做的静电产品

ESD工程师ESD审核员培训

培训&认证  更多>>
2008 ESD培训计划
iNARTE认证培训 NEW
首次命中,一次通过NEW!
ESD-china 课程特点IEC61340-5-1静电防护体系认证咨询培训辅导
ENICS(北京)通过ESD认证审核,已获得认证证书 
高水平授课方式的ESD培训
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系统级、元器件ESD试验

EST802静电放电发生器

((0 ~±20kV)手机各类电子设备

EST803静电放电发生器 (0 ~±30kV)汽车或其它行业电子设备抗静电试验)

电子元器件 ESD试验

(电子元器件ESD敏感度分类试验专用)

EST883 HBM ESD模拟

EST883A HBM/MM静电放电模拟器 (0~±20kV)
EST883B HBM/MM/CDM静电放电模拟器 (0~±20kV)
EST883C CDM静电放电模拟器 (0~±20kV)

静电电压测量类

EST101 防爆静电电压表

EST405静电动态计算机监测

静电电荷量测量类

EST111 数字电荷量仪
EST111A型 数字电荷皮库表
EST112 数字电量表
EST112A数字电量表

高电阻或超高阻测量类

EST120 数字高阻计
EST121 超高阻、微电流测量仪
EST301 人体综合电阻测试仪
EST601 防静电鞋、导电鞋测量仪
EST991导电和防静电材料体积电阻率测量装置

微电流或超微弱电流测量类

EST122 皮安电流表
EST121数字超高阻、微电流测量仪

静电发生器、高压直流电源

EST801静电发生器 (0 ~ +8kV)
EST801A静电发生器 (0-20kV)
EST703静电发生器(0 ~80kV)
EST704静电发生器(50~150kV)
EST705高精度静电发生器

EST802A静电发生器(0~±20kV)

 

静电应用   更多>>

EST702静电覆纸设备
EST706节能环保型静电分选机
静电放电棒

EST602/606人体静电表演装置

静电放电发生器(模拟器、放电枪)校对装置

静电电压表计量装置
多通道大气静电场强测试仪

静电吸附  静电分选

 

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